Advanced Metrology

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including surface description and data processing Features links to online content, including video, code and software

Produk Detail:

  • Author : X. Jane Jiang
  • Publisher : Academic Press
  • Pages : 374 pages
  • ISBN : 0128218169
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKAdvanced Metrology

Advanced Metrology

Advanced Metrology
  • Author : X. Jane Jiang,Paul J. Scott
  • Publisher : Academic Press
  • Release : 08 April 2020
GET THIS BOOKAdvanced Metrology

Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost. Includes case studies in every chapter to help readers implement the techniques discussed Provides unique advice from industry on hot subjects, including

Automotive Engine Metrology

Automotive Engine Metrology
  • Author : Salah H. R. Ali
  • Publisher : CRC Press
  • Release : 06 July 2017
GET THIS BOOKAutomotive Engine Metrology

In recent decades, metrology—an accurate and precise technology of high quality for automotive engines—has garnered a great deal of scientific interest due to its unique advanced soft engineering techniques in design and diagnostics. Used in a variety of scientific applications, these techniques are now widely regarded as safer, more efficient, and more effective than traditional ones. This book compiles and details the cutting-edge research in science and engineering from the Egyptian Metrology Institute (National Institute for Standards) that

Advanced Mathematical & Computational Tools in Metrology VII

Advanced Mathematical & Computational Tools in Metrology VII
  • Author : P. Ciarlini
  • Publisher : World Scientific
  • Release : 20 October 2021
GET THIS BOOKAdvanced Mathematical & Computational Tools in Metrology VII

This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in

Metrology and Diagnostic Techniques for Nanoelectronics

Metrology and Diagnostic Techniques for Nanoelectronics
  • Author : Zhiyong Ma,David G. Seiler
  • Publisher : CRC Press
  • Release : 27 March 2017
GET THIS BOOKMetrology and Diagnostic Techniques for Nanoelectronics

Nanoelectronics is changing the way the world communicates, and is transforming our daily lives. Continuing Moore’s law and miniaturization of low-power semiconductor chips with ever-increasing functionality have been relentlessly driving R&D of new devices, materials, and process capabilities to meet performance, power, and cost requirements. This book covers up-to-date advances in research and industry practices in nanometrology, critical for continuing technology scaling and product innovation. It holistically approaches the subject matter and addresses emerging and important topics in

Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications

Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
  • Author : Yosi Shacham-Diamand,Tetsuya Osaka,Madhav Datta,Takayuki Ohba
  • Publisher : Springer Science & Business Media
  • Release : 19 September 2009
GET THIS BOOKAdvanced Nanoscale ULSI Interconnects: Fundamentals and Applications

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation

Proceedings of 3rd International Conference on the Industry 4.0 Model for Advanced Manufacturing

Proceedings of 3rd International Conference on the Industry 4.0 Model for Advanced Manufacturing
  • Author : Jun Ni,Vidosav D. Majstorovic,Dragan Djurdjanovic
  • Publisher : Springer
  • Release : 08 May 2018
GET THIS BOOKProceedings of 3rd International Conference on the Industry 4.0 Model for Advanced Manufacturing

This book presents the proceedings of the 3rd International Conference on the Industry 4.0 Model for Advanced Manufacturing (AMP 2018), held in Belgrade, Serbia, on 5–7 June 2018, the latest in a series of high-level conferences that brings together experts from academia and industry to exchange knowledge, ideas, experiences, research findings, and information in the field of manufacturing. The book addresses a wide range of topics, including, for example, design of smart and intelligent products, developments in CAD/CAM technologies, rapid prototyping and reverse

Advanced Mathematical and Computational Tools in Metrology and Testing IX

Advanced Mathematical and Computational Tools in Metrology and Testing IX
  • Author : Franco Pavese
  • Publisher : World Scientific
  • Release : 20 October 2021
GET THIS BOOKAdvanced Mathematical and Computational Tools in Metrology and Testing IX

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to

Handbook of Silicon Semiconductor Metrology

Handbook of Silicon Semiconductor Metrology
  • Author : Alain C. Diebold
  • Publisher : CRC Press
  • Release : 29 June 2001
GET THIS BOOKHandbook of Silicon Semiconductor Metrology

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay