Metrology and Standardization for Nanotechnology

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.

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  • Author : Elisabeth Mansfield
  • Publisher : John Wiley & Sons
  • Pages : 626 pages
  • ISBN : 3527340394
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKMetrology and Standardization for Nanotechnology

Metrology and Standardization for Nanotechnology

Metrology and Standardization for Nanotechnology
  • Author : Elisabeth Mansfield
  • Publisher : John Wiley & Sons
  • Release : 10 April 2017
GET THIS BOOKMetrology and Standardization for Nanotechnology

For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide

Nanotechnology Research Directions for Societal Needs in 2020

Nanotechnology Research Directions for Societal Needs in 2020
  • Author : Mihail C. Roco,Chad A. Mirkin,Mark C. Hersam
  • Publisher : Springer Science & Business Media
  • Release : 17 June 2011
GET THIS BOOKNanotechnology Research Directions for Societal Needs in 2020

This volume presents a comprehensive perspective on the global scientific, technological, and societal impact of nanotechnology since 2000, and explores the opportunities and research directions in the next decade to 2020. The vision for the future of nanotechnology presented here draws on scientific insights from U.S. experts in the field, examinations of lessons learned, and international perspectives shared by participants from 35 countries in a series of high-level workshops organized by Mike Roco of the National Science Foundation (NSF), along with a

Measurement Technology for Micro-Nanometer Devices

Measurement Technology for Micro-Nanometer Devices
  • Author : Wendong Zhang,Xiujian Chou,Tielin Shi,Zongmin Ma,Haifei Bao,Jingdong Chen,Liguo Chen,Dachao Li,Chenyang Xue
  • Publisher : John Wiley & Sons
  • Release : 17 January 2017
GET THIS BOOKMeasurement Technology for Micro-Nanometer Devices

A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices

Micromanufacturing Engineering and Technology

Micromanufacturing Engineering and Technology
  • Author : Yi Qin
  • Publisher : William Andrew
  • Release : 02 July 2010
GET THIS BOOKMicromanufacturing Engineering and Technology

This book presents applicable knowledge of technology, equipment and applications, and the core economic issues of micromanufacturing for anyone with a basic understanding of manufacturing, material, or product engineering. It explains micro-engineering issues (design, systems, materials, market and industrial development), technologies, facilities, organization, competitiveness, and innovation with an analysis of future potential. The machining, forming, and joining of miniature / micro-products are all covered in depth, covering: grinding/milling, laser applications, and photo chemical etching; embossing (hot & UV), injection molding and

Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology
  • Author : Richard Leach
  • Publisher : Elsevier
  • Release : 17 May 2014
GET THIS BOOKFundamental Principles of Engineering Nanometrology

Working at the nano-scale demands an understanding of the high-precision measurement techniques that make nanotechnology and advanced manufacturing possible. Richard Leach introduces these techniques to a broad audience of engineers and scientists involved in nanotechnology and manufacturing applications and research. He also provides a routemap and toolkit for metrologists engaging with the rigor of measurement and data analysis at the nano-scale. Starting from the fundamentals of precision measurement, the author progresses into different measurement and characterization techniques. The focus on

Nanotechnology

Nanotechnology
  • Author : David J. Whitehouse,Shin Gijutsu Kaihatsu Jigyōdan (Japan). Exploratory Research for Advanced Technology
  • Publisher : Taylor & Francis
  • Release : 15 January 1991
GET THIS BOOKNanotechnology

Contributions from engineers, physicists, biologists, chemists and materials scientists are collected in this volume. The science of nanoscale engineering and manufacturing and the expanding range of applications of this science are discussed

Precision Nanometrology

Precision Nanometrology
  • Author : Wei Gao
  • Publisher : Springer Science & Business Media
  • Release : 14 June 2010
GET THIS BOOKPrecision Nanometrology

Precision Nanometrology describes the new field of precision nanometrology, which plays an important part in nanoscale manufacturing of semiconductors, optical elements, precision parts and similar items. It pays particular attention to the measurement of surface forms of precision workpieces and to stage motions of precision machines. The first half of the book is dedicated to the description of optical sensors for the measurement of angle and displacement, which are fundamental quantities for precision nanometrology. The second half presents a number

Nanotechnology and Advanced Materials

Nanotechnology and Advanced Materials
  • Author : Guo Hui Yang
  • Publisher : Trans Tech Publications Ltd
  • Release : 15 March 2012
GET THIS BOOKNanotechnology and Advanced Materials

Volume is indexed by Thomson Reuters CPCI-S (WoS). These are the proceedings of the International Conference on Nanotechnology Technology and Advanced Materials (ICNTAM 2012), held on 12-13th April 2012 in Hong Kong. They are divided into three sections. The first deals with Nanotechnology Technology. The second covers materials science and the third treats the use of manufacturing technology.

MEMS and Nanotechnology, Volume 4

MEMS and Nanotechnology, Volume 4
  • Author : Tom Proulx
  • Publisher : Springer Science & Business Media
  • Release : 21 May 2011
GET THIS BOOKMEMS and Nanotechnology, Volume 4

MEMS and Nanotechnology, Volume 4 represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; Optical Measurements, Modeling and, Metrology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
  • Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
  • Publisher : Springer Science & Business Media
  • Release : 30 March 2006
GET THIS BOOKScanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular

Advanced Development in Industry and Applied Mechanics

Advanced Development in Industry and Applied Mechanics
  • Author : Bale V. Reddy,Shishir Kumar Sahu,A. Kandasamy,Manuel de La Sen
  • Publisher : Trans Tech Publications Ltd
  • Release : 12 September 2014
GET THIS BOOKAdvanced Development in Industry and Applied Mechanics

Collection of selected, peer reviewed papers from the 3rd International Conference on Advances in Mechanics Engineering (ICAME 2014), 28-29 July, Hong Kong, China. Volume is indexed by Thomson Reuters CPCI-S (WoS). The 72 papers are grouped as follows: Chapter 1: Advanced Materials Engineering and Processing Technologies, Chapter 2: General Mechanical Engineering and Applied Mechanics, Chapter 3: Applied Thermodynamics and Thermal Effects, Chapter 4: Instrumentation, Measurement Technologies, Monitoring and Detection, Analysis and Methodology, Chapter 5: Mechatronics, Robotics and Automation of Manufacturing, Chapter 6: Civil Engineering and Building Materials, Chapter 7:

Atomic Force Microscopy

Atomic Force Microscopy
  • Author : Peter Eaton,Paul West
  • Publisher : Oxford University Press
  • Release : 25 March 2010
GET THIS BOOKAtomic Force Microscopy

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.