Atom Probe Tomography

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.

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  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Pages : 239 pages
  • ISBN : 1461542812
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKAtom Probe Tomography

Atom Probe Tomography

Atom Probe Tomography
  • Author : Michael K. Miller
  • Publisher : Springer Science & Business Media
  • Release : 06 December 2012
GET THIS BOOKAtom Probe Tomography

The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize

Atom Probe Tomography

Atom Probe Tomography
  • Author : Williams Lefebvre,Francois Vurpillot,Xavier Sauvage
  • Publisher : Academic Press
  • Release : 30 May 2016
GET THIS BOOKAtom Probe Tomography

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining

Atom-Probe Tomography

Atom-Probe Tomography
  • Author : Michael K. Miller,Richard G. Forbes
  • Publisher : Springer
  • Release : 31 July 2014
GET THIS BOOKAtom-Probe Tomography

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

Atom Probe Microscopy

Atom Probe Microscopy
  • Author : Baptiste Gault,Michael P. Moody,Julie M. Cairney,Simon P. Ringer
  • Publisher : Springer Science & Business Media
  • Release : 27 August 2012
GET THIS BOOKAtom Probe Microscopy

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption

Local Electrode Atom Probe Tomography

Local Electrode Atom Probe Tomography
  • Author : David J. Larson,Ty J. Prosa,Robert M. Ulfig,Brian P. Geiser,Thomas F. Kelly
  • Publisher : Springer Science & Business Media
  • Release : 12 December 2013
GET THIS BOOKLocal Electrode Atom Probe Tomography

This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through

Microstructural Geochronology

Microstructural Geochronology
  • Author : Desmond E. Moser,Fernando Corfu,James R. Darling,Steven M. Reddy,Kimberly Tait
  • Publisher : John Wiley & Sons
  • Release : 23 November 2017
GET THIS BOOKMicrostructural Geochronology

Microstructural Geochronology Geochronology techniques enable the study of geological evolution and environmental change over time. This volume integrates two aspects of geochronology: one based on classical methods of orientation and spatial patterns, and the other on ratios of radioactive isotopes and their decay products. The chapters illustrate how material science techniques are taking this field to the atomic scale, enabling us to image the chemical and structural record of mineral lattice growth and deformation, and sometimes the patterns of radioactive

Wide Bandgap Semiconductor Electronics And Devices

Wide Bandgap Semiconductor Electronics And Devices
  • Author : Singisetti Uttam,Razzak Towhidur,Zhang Yuewei
  • Publisher : World Scientific
  • Release : 10 December 2019
GET THIS BOOKWide Bandgap Semiconductor Electronics And Devices

With the dawn of Gallium Oxide (Ga2O₃) and Aluminum Gallium Nitride (AlGaN) electronics and the commercialization of Gallium Nitride (GaN) and Silicon Carbide (SiC) based devices, the field of wide bandgap materials and electronics has never been more vibrant and exciting than it is now. Wide bandgap semiconductors have had a strong presence in the research and development arena for many years. Recently, the increasing demand for high efficiency power electronics and high speed communication electronics, together with the

Atom-Probe Tomography

Atom-Probe Tomography
  • Author : Michael K. Miller,Richard G. Forbes
  • Publisher : Springer
  • Release : 02 August 2014
GET THIS BOOKAtom-Probe Tomography

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new

Atom-Probe Field Ion Microscopy

Atom-Probe Field Ion Microscopy
  • Author : Tien T. Tsong
  • Publisher : Cambridge University Press
  • Release : 15 September 2005
GET THIS BOOKAtom-Probe Field Ion Microscopy

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image. Field ion microscopy has been successfully used to study most metals and many alloys, and recently good field ion images of some semiconductors and even ceramic materials such as high temperature superconductors have been obtained. Although other microscopies are capable of achieving the same

Atom Probe Tomography of Hard Nitride and Boride Thin Films

Atom Probe Tomography of Hard Nitride and Boride Thin Films
  • Author : David L. J. Engberg
  • Publisher : Linköping University Electronic Press
  • Release : 02 August 2019
GET THIS BOOKAtom Probe Tomography of Hard Nitride and Boride Thin Films

Hard ceramic thin films, including TiSiN, ZrAlN, ZrB2, and ZrTaB2, with applications for wear-resistant coatings, have been studied using atom probe tomography and correlated with several other analytical techniques, including X-ray diffraction, electron microscopy, and elastic recoil detection analysis. Outstanding obstacles for quantitative atom probe tomography of ceramic thin films have been surmounted. Mass spectral overlaps in TiSiN, which make 28Si indistinguishable from 14N, was resolved by isotopic substitution with 15N, and the nanostructural distribution of elements was thus revealed

Nanoinformatics

Nanoinformatics
  • Author : Isao Tanaka
  • Publisher : Springer
  • Release : 15 January 2018
GET THIS BOOKNanoinformatics

This open access book brings out the state of the art on how informatics-based tools are used and expected to be used in nanomaterials research. There has been great progress in the area in which “big-data” generated by experiments or computations are fully utilized to accelerate discovery of new materials, key factors, and design rules. Data-intensive approaches play indispensable roles in advanced materials characterization. "Materials informatics" is the central paradigm in the new trend. "Nanoinformatics" is its essential subset, which

Modern Glass Characterization

Modern Glass Characterization
  • Author : Mario Affatigato
  • Publisher : John Wiley & Sons
  • Release : 10 September 2015
GET THIS BOOKModern Glass Characterization

The book consists of a series of edited chapters, each written by an expert in the field and focusing on a particular characterization technique as applied to glass. The book covers a variety of techniques ranging from the very common (like Raman and FTIR) to the most recent (and less well known) ones, like SEM for structural analysis and photoelastic measurements. The level of the chapters make it suitable for researchers and for graduate students about to start their research

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization
  • Author : Richard Haight,Frances M. Ross,James B. Hannon
  • Publisher : World Scientific
  • Release : 19 August 2022
GET THIS BOOKHandbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook

Springer Handbook of Microscopy

Springer Handbook of Microscopy
  • Author : Peter W. Hawkes,John C.H. Spence
  • Publisher : Springer Nature
  • Release : 02 November 2019
GET THIS BOOKSpringer Handbook of Microscopy

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science,

Crystal Plasticity Finite Element Methods

Crystal Plasticity Finite Element Methods
  • Author : Franz Roters,Philip Eisenlohr,Thomas R. Bieler,Dierk Raabe
  • Publisher : John Wiley & Sons
  • Release : 04 August 2011
GET THIS BOOKCrystal Plasticity Finite Element Methods

Written by the leading experts in computational materials science, this handy reference concisely reviews the most important aspects of plasticity modeling: constitutive laws, phase transformations, texture methods, continuum approaches and damage mechanisms. As a result, it provides the knowledge needed to avoid failures in critical systems udner mechanical load. With its various application examples to micro- and macrostructure mechanics, this is an invaluable resource for mechanical engineers as well as for researchers wanting to improve on this method and extend