Materials Science of Thin Films

This is the first book that can be considered a textbook on thin film science, complete with exercises at the end of each chapter. Ohring has contributed many highly regarded reference books to the AP list, including Reliability and Failure of Electronic Materials and the Engineering Science of Thin Films. The knowledge base is intended for science and engineering students in advanced undergraduate or first-year graduate level courses on thin films and scientists and engineers who are entering or require an overview of the field. Since 1992, when the book was first published, the field of thin films has expanded tremendously, especially with regard to technological applications. The second edition will bring the book up-to-date with regard to these advances. Most chapters have been greatly updated, and several new chapters have been added.

Produk Detail:

  • Author : Milton Ohring
  • Publisher : Academic Press
  • Pages : 794 pages
  • ISBN : 0125249756
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKMaterials Science of Thin Films

Materials Science of Thin Films

Materials Science of Thin Films
  • Author : Milton Ohring
  • Publisher : Academic Press
  • Release : 29 June 2022
GET THIS BOOKMaterials Science of Thin Films

This is the first book that can be considered a textbook on thin film science, complete with exercises at the end of each chapter. Ohring has contributed many highly regarded reference books to the AP list, including Reliability and Failure of Electronic Materials and the Engineering Science of Thin Films. The knowledge base is intended for science and engineering students in advanced undergraduate or first-year graduate level courses on thin films and scientists and engineers who are entering or require

Reliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices
  • Author : Milton Ohring,Lucian Kasprzak
  • Publisher : Academic Press
  • Release : 03 November 2014
GET THIS BOOKReliability and Failure of Electronic Materials and Devices

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on statistically predicting failure and product yields, this book can help the design engineer, manufacturing engineer, and quality control engineer all better understand the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects, and radiation

Engineering Materials Science

Engineering Materials Science
  • Author : Milton Ohring
  • Publisher : Academic Press
  • Release : 29 June 1995
GET THIS BOOKEngineering Materials Science

Milton Ohring's Engineering Materials Science integrates the scientific nature and modern applications of all classes of engineering materials. This comprehensive, introductory textbook will provide undergraduate engineering students with the fundamental background needed to understand the science of structure–property relationships, as well as address the engineering concerns of materials selection in design, processing materials into useful products, andhow material degrade and fail in service. Specific topics include: physical and electronic structure; thermodynamics and kinetics; processing; mechanical, electrical, magnetic, and optical

Influence of Temperature on Microelectronics and System Reliability

Influence of Temperature on Microelectronics and System Reliability
  • Author : Pradeep Lall,Michael Pecht,Edward B. Hakim
  • Publisher : CRC Press
  • Release : 24 April 1997
GET THIS BOOKInfluence of Temperature on Microelectronics and System Reliability

This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of operating temperatures. The author provides readers a sound scientific basis for system operation at realistic steady state temperatures without reliability penalties. Higher temperature performance than is commonly recommended is shown to be cost effective in production for life cycle costs. The microelectronic package considered in the book is assumed to

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
  • Author : Osamu Ueda,Stephen J. Pearton
  • Publisher : Springer Science & Business Media
  • Release : 22 September 2012
GET THIS BOOKMaterials and Reliability Handbook for Semiconductor Optical and Electron Devices

Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices.

Reliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices
  • Author : Robert Herrick,Osamu Ueda
  • Publisher : Woodhead Publishing
  • Release : 06 March 2021
GET THIS BOOKReliability of Semiconductor Lasers and Optoelectronic Devices

Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects.

Failure Analysis

Failure Analysis
  • Author : Marius Bazu,Titu Bajenescu
  • Publisher : John Wiley & Sons
  • Release : 08 March 2011
GET THIS BOOKFailure Analysis

Failure analysis is the preferred method to investigate product or process reliability and to ensure optimum performance of electrical components and systems. The physics-of-failure approach is the only internationally accepted solution for continuously improving the reliability of materials, devices and processes. The models have been developed from the physical and chemical phenomena that are responsible for degradation or failure of electronic components and materials and now replace popular distribution models for failure mechanisms such as Weibull or lognormal. Reliability engineers

Electronics Reliability–Calculation and Design

Electronics Reliability–Calculation and Design
  • Author : Geoffrey W. A. Dummer,Norman B. Griffin
  • Publisher : Elsevier
  • Release : 22 October 2013
GET THIS BOOKElectronics Reliability–Calculation and Design

Electronics Reliability–Calculation and Design provides an introduction to the fundamental concepts of reliability. The increasing complexity of electronic equipment has made problems in designing and manufacturing a reliable product more and more difficult. Specific techniques have been developed that enable designers to integrate reliability into their products, and reliability has become a science in its own right. The book begins with a discussion of basic mathematical and statistical concepts, including arithmetic mean, frequency distribution, median and mode, scatter or

Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization
  • Author : Dieter K. Schroder
  • Publisher : John Wiley & Sons
  • Release : 29 June 2022
GET THIS BOOKSemiconductor Material and Device Characterization

Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.

Reliability Physics and Engineering

Reliability Physics and Engineering
  • Author : J. W. McPherson
  • Publisher : Springer Science & Business Media
  • Release : 03 June 2013
GET THIS BOOKReliability Physics and Engineering

"Reliability Physics and Engineering" provides critically important information for designing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.

Proceedings of the International Workshop on Physics and Technology of Thin Films

Proceedings of the International Workshop on Physics and Technology of Thin Films
  • Author : Alireza Zaker Moshfegh
  • Publisher : World Scientific
  • Release : 29 June 2022
GET THIS BOOKProceedings of the International Workshop on Physics and Technology of Thin Films

Thin films science and technology plays an important role in the high-tech industries. Thin film technology has been developed primarily for the need of the integrated circuit industry. The demand for development of smaller and smaller devices with higher speed especially in new generation of integrated circuits requires advanced materials and new processing techniques suitable for future giga scale integration (GSI) technology. In this regard, physics and technology of thin films can play an important role to acheive this goal.

Humidity and Electronics

Humidity and Electronics
  • Author : Rajan Ambat,Kamila Piotrowska
  • Publisher : Woodhead Publishing
  • Release : 10 December 2021
GET THIS BOOKHumidity and Electronics

Humidity and Electronics: Corrosion Reliability Issues and Preventive Measures provides comprehensive information on humidity related corrosion reliability issues surrounding electronics and how to tackle potential issues from a pro-active-design-prevention perspective. The book contains a mix of academic and industrial relevance, making it suitable for a detailed understanding on humidity issues on electronics, both for materials and corrosion experts and electronics and electrical experts. It will be useful for researchers, academics, and industrial personals involved in materials, corrosion, and electronics reliability