Reliability Robustness and Failure Mechanisms of LED Devices

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDs Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution Focuses on the method to extract fundamental parameters from electrical and optical characterizations

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  • Author : Yannick Deshayes
  • Publisher : Elsevier
  • Pages : 172 pages
  • ISBN : 0081010885
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKReliability Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices

Reliability, Robustness and Failure Mechanisms of LED Devices
  • Author : Yannick Deshayes,Laurent Bechou
  • Publisher : Elsevier
  • Release : 27 March 2017
GET THIS BOOKReliability, Robustness and Failure Mechanisms of LED Devices

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies. This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses

Reliability, Robustness and Failure Mechanisms of Led Devices

Reliability, Robustness and Failure Mechanisms of Led Devices
  • Author : Yannick Deshayes,Laurent Bchou
  • Publisher : Iste Press - Elsevier
  • Release : 01 October 2016
GET THIS BOOKReliability, Robustness and Failure Mechanisms of Led Devices

"Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation" presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate

Reliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications
  • Author : Raphael Baillot,Yannick Deshayes
  • Publisher : Elsevier
  • Release : 09 March 2017
GET THIS BOOKReliability Investigation of LED Devices for Public Light Applications

Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications. Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models. The proposed technology and methodologies will help

Failure Mechanisms in Semiconductor Devices

Failure Mechanisms in Semiconductor Devices
  • Author : E. Ajith Amerasekera,Farid N. Najm
  • Publisher : Wiley-Blackwell
  • Release : 04 August 1997
GET THIS BOOKFailure Mechanisms in Semiconductor Devices

Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devices, semiconductor technology has become increasingly important. The high complexity of today's integrated circuits has engendered a demand for greater component reliability. Reflecting the need for guaranteed performance in consumer applications, this thoroughly updated edition includes more detailed material on reliability modelling and prediction. The book

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
  • Author : Danelle Mary Tanner,Rajeshuni Ramesham
  • Publisher : Society of Photo Optical
  • Release : 24 June 2021
GET THIS BOOKReliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Semiconductor Laser Engineering, Reliability and Diagnostics

Semiconductor Laser Engineering, Reliability and Diagnostics
  • Author : Peter W. Epperlein
  • Publisher : John Wiley & Sons
  • Release : 25 January 2013
GET THIS BOOKSemiconductor Laser Engineering, Reliability and Diagnostics

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering