Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and devices Analyzes key insights on semiconductor materials and device physics derived from the SNDM technique

Produk Detail:

  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Pages : 256 pages
  • ISBN : 0081028032
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKScanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy
  • Author : Yasuo Cho
  • Publisher : Woodhead Publishing
  • Release : 20 May 2020
GET THIS BOOKScanning Nonlinear Dielectric Microscopy

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has

Ferroelectric Thin Films

Ferroelectric Thin Films
  • Author : Masanori Okuyama
  • Publisher : Springer Science & Business Media
  • Release : 22 February 2005
GET THIS BOOKFerroelectric Thin Films

Ferroelectric thin films continue to attract much attention due to their developing applications in memory devices, FeRAM, infrared sensors, piezoelectric sensors and actuators. This book, aimed at students, researchers and developers, gives detailed information about the basic properties of these materials and the associated device physics. The contributing authors are acknowledged experts in the field.

Polar Oxides

Polar Oxides
  • Author : Rainer Waser,Ulrich Böttger,Stephan Tiedke
  • Publisher : John Wiley & Sons
  • Release : 06 March 2006
GET THIS BOOKPolar Oxides

Here, more than 20 experts from leading research institutes around the world present the entire scope of this rapidly developing field. In so doing, they cover a wide range of topics, including the characterization and investigation of structural, dielectric and piezoelectric properties of ceramic materials, a well as phase transitions, electrical and optical properties and microscopic investigations. Another feature is a complete profile of the properties of polar oxides -- from their proof to their latest applications. Throughout, the authors review,

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
  • Author : Marin Alexe,Alexei Gruverman
  • Publisher : Springer Science & Business Media
  • Release : 06 April 2004
GET THIS BOOKNanoscale Characterisation of Ferroelectric Materials

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate

Nanoscale Characterisation of Ferroelectric Materials

Nanoscale Characterisation of Ferroelectric Materials
  • Author : Marin Alexe,Alexei Gruverman
  • Publisher : Springer Science & Business Media
  • Release : 09 March 2013
GET THIS BOOKNanoscale Characterisation of Ferroelectric Materials

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate

Roadmap of Scanning Probe Microscopy

Roadmap of Scanning Probe Microscopy
  • Author : Seizo Morita
  • Publisher : Springer Science & Business Media
  • Release : 30 December 2006
GET THIS BOOKRoadmap of Scanning Probe Microscopy

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
  • Author : Paula M. Vilarinho,Yossi Rosenwaks,Angus Kingon
  • Publisher : Springer Science & Business Media
  • Release : 30 March 2006
GET THIS BOOKScanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular

Applied Scanning Probe Methods X

Applied Scanning Probe Methods X
  • Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
  • Publisher : Springer Science & Business Media
  • Release : 20 December 2007
GET THIS BOOKApplied Scanning Probe Methods X

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
  • Author : Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
  • Publisher : Springer Science & Business Media
  • Release : 16 April 2004
GET THIS BOOKFerroelectric Random Access Memories

The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.

Ferroelectric Random Access Memories

Ferroelectric Random Access Memories
  • Author : Hiroshi Ishiwara,Masanori Okuyama,Yoshihiro Arimoto
  • Publisher : Springer Science & Business Media
  • Release : 16 April 2004
GET THIS BOOKFerroelectric Random Access Memories

The book consists of 5 parts: (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects; each part is further divided into several chapters. Because of the wide range of topics discussed, each chapter in this book was written by one of the best authors knowing the specific topic very well.