System on Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

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  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Pages : 896 pages
  • ISBN : 9780080556802
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKSystem on Chip Test Architectures

System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOKSystem-on-Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles Stroud,Nur Touba
  • Publisher : Unknown Publisher
  • Release : 20 September 2021
GET THIS BOOKSystem-on-Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

On-Chip Communication Architectures

On-Chip Communication Architectures
  • Author : Sudeep Pasricha,Nikil Dutt
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOKOn-Chip Communication Architectures

Over the past decade, system-on-chip (SoC) designs have evolved to address the ever increasing complexity of applications, fueled by the era of digital convergence. Improvements in process technology have effectively shrunk board-level components so they can be integrated on a single chip. New on-chip communication architectures have been designed to support all inter-component communication in a SoC design. These communication architecture fabrics have a critical impact on the power consumption, performance, cost and design cycle time of modern SoC designs.

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
  • Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
  • Publisher : Elsevier
  • Release : 14 August 2006
GET THIS BOOKVLSI Test Principles and Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Design and Test Technology for Dependable Systems-on-chip

Design and Test Technology for Dependable Systems-on-chip
  • Author : Raimund Ubar,Jaan Raik,Heinrich Theodor Vierhaus
  • Publisher : IGI Global
  • Release : 01 January 2011
GET THIS BOOKDesign and Test Technology for Dependable Systems-on-chip

"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Reliability, Availability and Serviceability of Networks-on-Chip

Reliability, Availability and Serviceability of Networks-on-Chip
  • Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
  • Publisher : Springer Science & Business Media
  • Release : 23 September 2011
GET THIS BOOKReliability, Availability and Serviceability of Networks-on-Chip

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Essential Issues in SOC Design

Essential Issues in SOC Design
  • Author : Youn-Long Steve Lin
  • Publisher : Springer Science & Business Media
  • Release : 31 May 2007
GET THIS BOOKEssential Issues in SOC Design

This book originated from a workshop held at the DATE 2005 conference, namely Designing Complex SOCs. State-of-the-art in issues related to System-on-Chip (SoC) design by leading experts in the fields, it covers IP development, verification, integration, chip implementation, testing and software. It contains valuable academic and industrial examples for those involved with the design of complex SOCs.

Network-on-Chip

Network-on-Chip
  • Author : Santanu Kundu,Santanu Chattopadhyay
  • Publisher : CRC Press
  • Release : 03 September 2018
GET THIS BOOKNetwork-on-Chip

Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release : 30 September 2002
GET THIS BOOKSOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland,

Computer System Design

Computer System Design
  • Author : Michael J. Flynn,Wayne Luk
  • Publisher : John Wiley & Sons
  • Release : 08 August 2011
GET THIS BOOKComputer System Design

The next generation of computer system designers will be less concerned about details of processors and memories, and more concerned about the elements of a system tailored to particular applications. These designers will have a fundamental knowledge of processors and other elements in the system, but the success of their design will depend on the skills in making system-level tradeoffs that optimize the cost, performance and other attributes to meet application requirements. This book provides a new treatment of computer

Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low Power Devices
  • Author : Patrick Girard,Nicola Nicolici,Xiaoqing Wen
  • Publisher : Springer Science & Business Media
  • Release : 11 March 2010
GET THIS BOOKPower-Aware Testing and Test Strategies for Low Power Devices

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores

SOC Design Methodologies

SOC Design Methodologies
  • Author : Michel Robert,Bruno Rouzeyre,Christian Piguet,Marie-Lise Flottes
  • Publisher : Springer
  • Release : 15 March 2013
GET THIS BOOKSOC Design Methodologies

The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release : 17 April 2013
GET THIS BOOKSOC (System-on-a-Chip) Testing for Plug and Play Test Automation

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

Design of Systems on a Chip: Design and Test

Design of Systems on a Chip: Design and Test
  • Author : Ricardo Reis,Marcelo Soares Lubaszewski,Jochen A.G. Jess
  • Publisher : Springer Science & Business Media
  • Release : 06 May 2007
GET THIS BOOKDesign of Systems on a Chip: Design and Test

This book is the second of two volumes addressing the design challenges associated with new generations of semiconductor technology. The various chapters are compiled from tutorials presented at workshops in recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip.