System on Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

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  • Author : Laung-Terng Wang
  • Publisher : Morgan Kaufmann
  • Pages : 896 pages
  • ISBN : 9780080556802
  • Rating : 4/5 from 21 reviews
CLICK HERE TO GET THIS BOOKSystem on Chip Test Architectures

System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOKSystem-on-Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

System-on-Chip Test Architectures

System-on-Chip Test Architectures
  • Author : Laung-Terng Wang,Charles Stroud,Nur Touba
  • Publisher : Unknown Publisher
  • Release : 24 January 2022
GET THIS BOOKSystem-on-Chip Test Architectures

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers

Reliability, Availability and Serviceability of Networks-on-Chip

Reliability, Availability and Serviceability of Networks-on-Chip
  • Author : Érika Cota,Alexandre de Morais Amory,Marcelo Soares Lubaszewski
  • Publisher : Springer Science & Business Media
  • Release : 23 September 2011
GET THIS BOOKReliability, Availability and Serviceability of Networks-on-Chip

This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Labs on Chip

Labs on Chip
  • Author : Eugenio Iannone
  • Publisher : CRC Press
  • Release : 03 September 2018
GET THIS BOOKLabs on Chip

Labs on Chip: Principles, Design and Technology provides a complete reference for the complex field of labs on chip in biotechnology. Merging three main areas— fluid dynamics, monolithic micro- and nanotechnology, and out-of-equilibrium biochemistry—this text integrates coverage of technology issues with strong theoretical explanations of design techniques. Analyzing each subject from basic principles to relevant applications, this book: Describes the biochemical elements required to work on labs on chip Discusses fabrication, microfluidic, and electronic and optical detection techniques Addresses

VLSI-SOC: From Systems to Chips

VLSI-SOC: From Systems to Chips
  • Author : Manfred Glesner,Ricardo Reis,Leandro Indrusiak,Vincent Mooney,Hans Eveking
  • Publisher : Springer Science & Business Media
  • Release : 17 May 2006
GET THIS BOOKVLSI-SOC: From Systems to Chips

This monograph, divided into four parts, presents a comprehensive treatment and systematic examination of cycle spaces of flag domains. Assuming only a basic familiarity with the concepts of Lie theory and geometry, this work presents a complete structure theory for these cycle spaces, as well as their applications to harmonic analysis and algebraic geometry. Key features include: accessible to readers from a wide range of fields, with all the necessary background material provided for the nonspecialist; many new results presented

Power-Aware Testing and Test Strategies for Low Power Devices

Power-Aware Testing and Test Strategies for Low Power Devices
  • Author : Patrick Girard,Nicola Nicolici,Xiaoqing Wen
  • Publisher : Springer Science & Business Media
  • Release : 11 March 2010
GET THIS BOOKPower-Aware Testing and Test Strategies for Low Power Devices

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores

SOC Design Methodologies

SOC Design Methodologies
  • Author : Michel Robert,Bruno Rouzeyre,Christian Piguet,Marie-Lise Flottes
  • Publisher : Springer
  • Release : 15 March 2013
GET THIS BOOKSOC Design Methodologies

The 11 th IFIP International Conference on Very Large Scale Integration, in Montpellier, France, December 3-5,2001, was a great success. The main focus was about IP Cores, Circuits and System Designs & Applications as well as SOC Design Methods and CAD. This book contains the best papers (39 among 70) that have been presented during the conference. Those papers deal with all aspects of importance for the design of the current and future integrated systems. System on Chip (SOC) design is today a big

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release : 17 April 2013
GET THIS BOOKSOC (System-on-a-Chip) Testing for Plug and Play Test Automation

System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation

SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
  • Author : Krishnendu Chakrabarty
  • Publisher : Springer Science & Business Media
  • Release : 30 September 2002
GET THIS BOOKSOC (System-on-a-Chip) Testing for Plug and Play Test Automation

Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland,

VLSI Test Principles and Architectures

VLSI Test Principles and Architectures
  • Author : Laung-Terng Wang,Cheng-Wen Wu,Xiaoqing Wen
  • Publisher : Elsevier
  • Release : 14 August 2006
GET THIS BOOKVLSI Test Principles and Architectures

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

Built-in-Self-Test and Digital Self-Calibration for RF SoCs

Built-in-Self-Test and Digital Self-Calibration for RF SoCs
  • Author : Sleiman Bou-Sleiman,Mohammed Ismail
  • Publisher : Springer Science & Business Media
  • Release : 23 September 2011
GET THIS BOOKBuilt-in-Self-Test and Digital Self-Calibration for RF SoCs

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

Information and Business Intelligence

Information and Business Intelligence
  • Author : Xilong Qu,Chenguang Yang
  • Publisher : Springer
  • Release : 25 April 2012
GET THIS BOOKInformation and Business Intelligence

This two-volume set (CCIS 267 and CCIS 268) constitutes the refereed proceedings of the International Conference on Information and Business Intelligence, IBI 2011, held in Chongqing, China, in December 2011. The 229 full papers presented were carefully reviewed and selected from 745 submissions. The papers address topics such as communication systems; accounting and agribusiness; information education and educational technology; manufacturing engineering; multimedia convergence; security and trust computing; business teaching and education; international business and marketing; economics and finance; and control systems and digital convergence.

On-Chip Communication Architectures

On-Chip Communication Architectures
  • Author : Sudeep Pasricha,Nikil Dutt
  • Publisher : Morgan Kaufmann
  • Release : 28 July 2010
GET THIS BOOKOn-Chip Communication Architectures

Over the past decade, system-on-chip (SoC) designs have evolved to address the ever increasing complexity of applications, fueled by the era of digital convergence. Improvements in process technology have effectively shrunk board-level components so they can be integrated on a single chip. New on-chip communication architectures have been designed to support all inter-component communication in a SoC design. These communication architecture fabrics have a critical impact on the power consumption, performance, cost and design cycle time of modern SoC designs.

Information and Communication Technology for Competitive Strategies

Information and Communication Technology for Competitive Strategies
  • Author : Simon Fong,Shyam Akashe,Parikshit N. Mahalle
  • Publisher : Springer
  • Release : 30 August 2018
GET THIS BOOKInformation and Communication Technology for Competitive Strategies

This book contains 74 papers presented at ICTCS 2017: Third International Conference on Information and Communication Technology for Competitive Strategies. The conference was held during 16–17 December 2017, Udaipur, India and organized by Association of Computing Machinery, Udaipur Professional Chapter in association with The Institution of Engineers (India), Udaipur Local Center and Global Knowledge Research Foundation. This book contains papers mainly focused on ICT for Computation, Algorithms and Data Analytics and IT Security etc.

Processor Description Languages

Processor Description Languages
  • Author : Prabhat Mishra,Nikil Dutt
  • Publisher : Elsevier
  • Release : 28 July 2011
GET THIS BOOKProcessor Description Languages

Efficient design of embedded processors plays a critical role in embedded systems design. Processor description languages and their associated specification, exploration and rapid prototyping methodologies are used to find the best possible design for a given set of applications under various design constraints, such as area, power and performance. This book is the first, comprehensive survey of modern architecture description languages and will be an invaluable reference for embedded system architects, designers, developers, and validation engineers. Readers will see that